VITARASHEED M. A. AZZAMBackgroundEducation: B.Sc. (Honors), Electrical Engineering (Electronics and Communications), Cairo University, Cairo, Egypt, 1967. Experience: Professor of Physics, The American University in Cairo, September 1997 - August 1999 (on leave from UNO). Acting Chairman, Department of Electrical Engineering, University of New Orleans, August 1988 ‑ July 1989 and August 1992 ‑ July, 1993. Fulbright Senior Research Scholar and Visiting Professor, Département de Physique du Solide, Université de Provence, Marseille, France, September 1985 ‑ July 1986. Professor of Electrical Engineering and Full Member of the Graduate Faculty, University of New Orleans, August 1981 ‑ July 1982. Associate Professor of Electrical Engineering and Associate Member of the Graduate Faculty, University of New Orleans, August 1979 ‑ July 1981. Associate Professor of Research in Engineering, Research Associate Professor of Internal Medicine, and Graduate Faculty Fellow, University of Nebraska, Lincoln, and University of Nebraska Medical Center, Omaha, September 1974 ‑ August 1979. Postdoctoral Research Fellow, Department of Electrical Engineering, University of Nebraska, Lincoln, January 1972 ‑ September 1974. Graduate Research Assistant and Lab Instructor, Department of Electrical Engineering, University of Nebraska, Lincoln, September 1969 ‑ December 1971. Teaching Assistant, Department of Electrical Engineering, Cairo University, September 1967 ‑ August 1969.
Scholarly and Creative ProductivityPublications A. Scholarly Books and Journal Special Issues Selected Papers on Ellipsometry, SPIE Milestone Series (SPIE‑The International Society for Optical Engineering, Bellingham, Washington, 1991), R. M. A. Azzam, Editor. Thin Film Optical Devices for Polarized Light, Feature Issue, Vol. 5, No. 9, Journal of the Optical Society of America A (OSA, Washington, D.C., 1988), R. M. A. Azzam and W. H. Southwell, Editors. Optical Polarimetry, Special Issue, Vol. 20, Nol 1, Optical Engineering (SPIE ‑ The International Society for Optical Engineering, Bellingham, Washington, 1981), R.M.A. Azzam and D. L. Coffeen, Guest Editors. Proceedings of the Fourth International Conference on Ellipsometry, Vol. 96 of Surface Science (North‑Holland, Amsterdam, 1980), R. H. Muller, R.M.A. Azzam, and D. E. Aspnes, Editors. Optical Polarimetry: Instrumentation and Applications, Vol. 112 of SPIE Proceedings (SPIE‑The International Society for Optical Engineering, Bellingham, Washington, 1977), R.M.A. Azzam and D. L. Coffeen, Editors. Proceedings of the Third International Conference on Ellipsometry, Vol. 56 of Surface Science (North‑Holland, Amsterdam, 1976), N.M. Bashara and R.M.A. Azzam, Editors. Polarized Light: Instruments, Devices, Applications, Vol. 88 of SPIE Proceedings (SPIE‑The Inernational Society for Optical Engineering, Bellingham, Washington, 1976), W.L. Hyde and R.M.A. Azzam, Editors.
B. Book Chapters: R. M. A. Azzam, "Ellipsometry," chapter 27 in vol. II of the Handbook of Optics, M. Bass, editor-in-chief, sponsored by the Optical Society of America (McGraw‑Hill, New York, 1995). Invited R. M. A. Azzam and I. A. Bryzgalov, "Ellipsometry and Modulation Spectroscopy," Section 6.7.4 in Vol. 1 of Advanced Mineralogy, A. S. Marfunin, editor (Springer-Verlag, Berlin, 1994). Invited.
C. US Patents U.S. Patent No. 4,681,450, July 21, 1987, for a "Photodetector Arrangement for Measuring the State of Polarization of Light." This invention has been featured in Lasers and Applications (September 1985), Chemical and Engineering News (July 13, 1987 & October 12, 1992), Laser Focus World (March, 1993), and in The New York Times (July 25, 1987), and other newspapers. Corresponding Japanese, Canadian, and European patents have been secured. U.S. Patent No. 4,725,145, February 16, 1988, for a "Photodetector Arrangement for Measuring the State of Polarization of Light." This invention covers the rotating‑detector and two‑detector ellipsometers. Corresponding Japanese, Canadian, and European patents have been secured. U. S. Patent No. 5,337,146, August 9, 1994 "Diffraction‑Grating Photopolarimeters and Spectrophotopolarimeters." This patent has been licensed to Research Corporation Technologies and sublicensed to Containerless Research, Inc. U. S. Patent No. 5,796,098, August 18, 1998, “Sensor for Rotational Velocity and Rotational Acceleration.”
D. Journal Articles
Presentations at Professional Meetings(Partial list, 1999-2005) 2. R. M. A. Azzam, “Circular polarization Michelson interferometer,” Annual Meeting of the Optical Society of America, Santa Clara, CA, Sept. 28-30, 1999. 3. R. M. A. Azzam, “Correlation of Fresnel’s interface reflection coefficients of external and internal reflection at the same angle of incidence,” SPIE conference on Polarization Measurement, Analysis, and Remote Sensing II, Denver, CO, July 19-21, 1999. (Invited) 4. R. M. A. Azzam, “Polarization Michelson inteferometer: Principles and applications,” SPIE Conference on Polarization Measurement, Analysis, and Remote Sensing II, Denver, CO, July 19-21, 1999. (Invited) 5 A. M. El-Saba, R. M. A. Azzam, et. al. “Infrared parallel-slab division-of-amplitude photopolarimeter,” SPIE Conference on Polarization Measurement, Analysis, and Remote Sensing II, Denver, CO, July 19-21, 1999. 6 A. M. El-Saba, R. M. A. Azzam, et. al. “Design and analysis of a beam splitter for the equipartition of infrared input power,” SPIE Conference on Polarization Measurement, Analysis, and Remote Sensing II, Denver, CO, July 19-21, 1999. 7. S. Krishnan, S. Hampton, B. Taylor, and R. M. A. Azzam, “Spectral polarization measurement using the grating division-of-amplitude photopolarimeter,” Optical Society of America Topical Meeting on Diffractive Optics and Micro-Optics,@ Quebec City, Canada, June 18-23, 2000. 8. J. Liu and R. M. A. Azzam, “Half-wave infrared reflection retarders using two-dimensional ZnS surface relief grating on Au Substrate at 45-degree angle of incidence,” SPIE Conference on Polarization Measurement, Analysis, and Remote Sensing III, San Diego, CA, 2-3 August 2000. 9. A. M. El-Saba and R. M. A. Azzam, “High-efficiency all-dielectric strip-coated beam splitters for the equipartition of infrared input power,” SPIE Conference on Polarization Measurement, Analysis, and Remote Sensing III, San Diego, CA, 2-3 August 2000. 10. R. M. A. Azzam, “Ellipsometry: A sophisticated tool for optical metrology,” SPIE Conference on Optical Metrology Road Map for the Semiconductor Industry, San Diego, CA, July 30-31, 2001. (Invited) 11. R. M. A. Azzam and A. De, “Circular polarization beam splitter using embedded symmetric multilayer coating,” Annual Meeting of the Optical Society of America, Long Beach, CA, Oct. 14-18, 2001. 12. R. M. A. Azzam and E. Ugbo, “Reflection of p-polarized light at the surface of an absorbing medium: Range of incidence angle for which the reflection at oblique incidence is less than that at normal incidence,” Annual Meeting of the Optical Society of America, Long Beach, CA, Oct. 14-18 (2001). 13. A. M. El-Saba and R. M. A. Azzam, “Performance of reflection polarizers using bare semiconductor substrates in the visible and near-uv spectrum,” 46th Annual Meeting of SPIE - The International Society for Optical Engineering, San Diego, CA, 29 July- 3 Aug., 2001. 14. M. A. Howlader and R. M. A. Azzam, “Negligible polarization aberrations of antireflection-coated optical systems,” 46th Annual Meeting of SPIE - The International Society for Optical Engineering, San Diego, CA, 29 July- 3 Aug., 2001. 15. R. M. A. Azzam and C. L. Spinu, “Infrared polarizers and retarders using internal reflection at the Si-SiO2 interface,” Annual Meeting of the Optical Society of America, Orlando, FL, 29 Sept.- 3 Oct., 2002. (Invited) 16. A. De and R. M. A. Azzam, “Optimal coated silicon membrane beam splitters for the division-of-amplitude photopolarimeter,” Annual Meeting of the Optical Society of America, Orlando, FL, 29 Sept.- 3 Oct., 2002. 17. S. Krishnan, R. M. A. Azzam, and S. Hampton, “Spectroscopic ellipsometry using the grating division-of-amplitude photopolarimeter (G-DOAP),” 3rth International Conference on Spectroscopic Ellipsometry, Vienna, Austria, 6-11 July, 2003. 18. R. M. A. Azzam, F. Sudratjat, and M. Nazim Uddin, “Transmission spectroscopic ellipsometer (TSELL) using prismatic substrates,” 3rth International Conference on Spectroscopic Ellipsometry, Vienna, Austria, 6-11 July, 2003. 19. R. M. A. Azzam, F. Sudratjat, “Single-layer-coated silicon-wedge beam splitter for the division-of-amplitude photopolarimeter,” Annual Meeting of the Optical Society of America, Rochester, NY, 29 Sept. - 3 Oct., 2004. 20. R. M. A. Azzam and C. L. Spinu, “Linear-to-circular polarization transformation upon optical tunneling through an embedded low-index film,” Annual Meeting of the Optical Society of America, Rochester, NY, 29 Sept. - 3 Oct., 2004.
Other Scholarly and Professional ActivitiesA. Service as a Reviewer *Published book reviews in the Journal of the Optical Society of America, Applied Optics, Optics News, Physics Today, and Optical Engineering. *Referee of papers for the Journal of the Optical Society of America, Applied Optics, Optics Letters, Optics Express, Optical Engineering, Journal of Modern Optics, European Journal of Pure and Applied Optics, Europhysics Letters, Review of Scientific Instruments, Optics Communications, Journal of Vacuum Science and Technology, Thin Solid Films, and American Journal of Physics. *Reviewer of proposals for the National Science Foundation, Research Corporation, State of Louisiana Board of Regents, and the Petroleum Research Fund. *Book proposal reviewer for North‑Holland, Springer‑Verlag, and Academic Press. *External Ph. D. thesis examiner, University of Alabama-Huntsville, Université Laval (Québec, Canada), Université de Neuchâtel (Switzerland), University of Sofia (Bulgaria), Ain Shams University (Cairo, Egypt), and Andhra University (India). *Consultant, Ph. D. Program in Electro‑Optics, University of Dayton, 1990. B. Service in Professional Organizations *Member, Publications Council, Optical Society of America, Washington, D. C., 2004-2006. *Member, Ad Hoc Committee to Review the Journal of the Optical Society of America A, 1991‑1992. *Chairman, 1987 Max Born Award Committee; Member of the 1984, 1985, 1986, and 1988 Max Born Award Committees of the Optical Society of America. *Extensive service in organizing national and international conferences in optics. C. Editorship of Journals *Topical Editor, Polarization Optics, Applied Optics (Published by the Optical Society of America), 1993‑1999. *Topical Editor, Polarization and Thin Films, Journal of the Optical Society of America A, 1984‑1989. D. Professional and Scientific Society Membership Fellow, Optical Society of America
Awards and Recognition*2005 G. G. Stokes Award of SPIE – The International Society for Optical Engineering, for exceptional contributions to the field of optical polarization. *1993 Photonics Circle of Excellence Award for the StokesMeter, an instrument for measuring light polarization now available from Gaertner Scientific Corporation of Chicago, Illinois. *1993 R&D 100 AWARD for the StokesMeter, R&D Magazine, October, 1993. *Outstanding American Inventor and Finalist, 1988 America's Inventor of the Year Award, Intellectual Property Owners (IPO), Inc., Washington, D.C., for the invention of the four‑detector photopolarimeter. This device was described as "among the most outstanding recent American inventions," by Donald W. Banner, former President of IPO and former U.S. Commissioner of Patents and Trademarks. *Fulbright Senior Research Scholar, France, September 1985‑July 1986. *Citation for Outstanding Service, Society of Photo‑Optical Instrumentation Engineers, 1977 and 1978. *Invited speaker at universities (Louisiana State University, University of Arizona, University of Colorado, University of Alabama‑Huntsville, University of South Alabama, Alabama A & M University, Université de Québec à Trois Rivières, Université de Provence‑Marseille, Université de Luminy‑Marseille, Université de Neuchâtel‑Switzerland, Ecole Polytechnique Fédérale de Lausanne‑Switzerland, Uppsala University, Sweden, University of Linkoping, Sweden), and Corporate and Research Laboratories (Michelson Laboratory, Research Corporation, Coherent, 3M, KLA-Tencor, Vought Corporation, ENEA‑ Italy and others). *Invited lecturer as a Fulbright Scholar, Department of Electrical Engineering, Imperial College of Science and Technology, London, England, June 30‑July 4, 1986. *Listed in WHO'S WHO IN TECHNOLOGY, WHO'S WHO IN ENGINEERING, AMERICAN MEN AND WOMEN OF SCIENCE, MARQUIS INTERNATIONAL WHO'S WHO IN OPTICAL SCIENCES AND ENGINEERING, WHO'S WHO IN AMERICAN EDUCATION, WHO'S WHO IN THE SOUTH AND SOUTHWEST, WHO'S WHO IN THE WORLD. *Received thousands of citations of my published work in more than a 100 top science and engineering journals, 1975-2005.
Funded ResearchPrincipal/co-principal investigator of numerous projects funded by federal, state, and industrial sponsors.
Thesis/Dissertation AdvisingSupervised 4 postdoctoral research associates, 4 Ph. D. students and 30 M. Sc. students.
COURSES TAUGHT AT THE UNIVERSITY OF NEW ORLEANS (UNO)Undergraduate: Electric Circuits I & II, Engineering Electromagnetics, Basic Electric Machinery, Digital Logic Design, Engineering Optics Graduate: Engineering Optics, Fourier Optics, Introduction to Lasers, Polarization Optics, and special topics (Holography, Lightwave Communication Systems)
COURSES TAUGHT AT THE AMERICANUNIVERSITY IN CAIROScientific Thinking; Classical Mechanics, Sound & Heat; Electricity and Magnetism; Waves, Optics, and Atomic Physics; Introduction to Solid State Physics
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