APPENDIX II
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*Co‑Organizer, Third International Conference on Ellipsometry, Lincoln, Nebraska, September 23‑25, 1975.
*Co‑Chair and Co‑Organizer, SPIE Conference on Polarized Light, Society of Photo‑Optical Instrumentation Engineers, San Diego, California, August 24‑25, 1976.
*Co‑Chair and Co‑Organizer, SPIE Conference on Optical Polarimetry, Society of Photo‑Optical Instrumentation Engineers, San Diego, California, August 23‑24, 1977.
*Co‑Organizer, Fourth International Conference on Ellipsometry, Lawrence Berkeley Laboratory, University of California, Berkeley, California, August 20‑22, 1979.
*Member of the Conference Committee, Session Organizer and Chair, Third International Conference on Lasers & Applications (LASERS '80), New Orleans, Louisiana, December 15‑19, 1980.
*Member of the Conference Committee, Session Co‑Organizer and Co‑Chair, Fourth International Conference on Lasers & Applications (LASERS '81), New Orleans, Louisiana, December 14‑18, 1981.
*Member of the Conference Committee, Session Organizer and Chair, Fifth International Conference on Lasers & Applications (LASERS '82), New Orleans, Louisiana, December 13‑17, 1982.
*Member of the International Scientific Committee, International Conference on Ellipsometry and Other Optical Methods for Surface and Thin‑Film Analysis, Paris, France, June 7‑10, 1983.
*Session Chair and Panelist, Annual Meeting of the Optical Society of America, New Orleans, Louisiana, October 17‑20, 1983.
*Conference Co‑Chair, Co‑organizer, and Session Chair, SolidState Optical Control Devices, Society of Photo‑Optical Instrumentation Engineers, Los Angeles, California, January 26‑27, 1984.
*Panelist, Thin Film Technologies II, SPIE‑The International Society for Optical Engineering, Innsbruck, Austria, April 15‑17, 1986.
*Invited Speaker and Session Chair, The 7th International Conference on Thin Films, New Delhi, India, December 7‑11, 1987.
*Member of the Program Committee, Opening Session Chair, and Invited Speaker, Polarization Considerations for Optical Systems, SPIE‑The International Society for Optical Engineering, Los Angeles, California, January 10‑15, 1988.
*Session Chair, Optical Interference Coatings Topical Meeting, Optical Society of America, Tucson, Arizona, April 12‑15, 1988.
*Member of the Program Committee, Organizer and Chair of the Symposium on Applications of Polarimetry. Instructor, short course on Ellipsometry, Annual Meeting of the Optical Society of America, Santa Clara, California, October 31 ‑ November 4, 1988.
*Member of the Program Committee, and Chair of 2 sessions, Polarization Considerations for Optical Systems II, SPIE 33rd Annual International Symposium on Optical & Optoelectronic Applied Science and Engineering San Diego, California, August 9‑11, 1989.
*Session Chair, Annual Meeting of the Optical Society of America, Orlando, Florida, October 15‑20, 1989.
*Member of the Program Committee, Session Chair, Panelist, and Short‑Course Instructor, Polarimetry: Radar, Infrared, Visible, Ultraviolet, X‑Ray, SPIE Conference, Huntsville, Alabama, May 14‑17, 1990.
*Member of the Program Committee, lead Invited Speaker, and Session Chair, Polarization Analysis and Measurement, SPIE International Symposium on Optical Applied Science and Engineering, San Diego, California, July 19‑24, 1992.
*Member of the International Advisory Committee, Invited Speaker, and Session Chair, First International Conference on Spectroscopic Ellipsometry, Paris, France, January 11‑14, 1993.
*Member of the Program Committee, Invited Speaker, and Session Chair, Polarization Analysis and Measurement II, SPIE International Symposium on Optics, Imaging and Instrumentation, San Diego, California, July 24‑29, 1994.
*Invited Tutorial on Ellipsometry, Annual Meeting of the Optical Society of America, Dallas, Texas, October 2‑7, 1994.
*Invited Speaker, International Conference on Metallurgical Coatings and Thin Films, San Diego, California, April 24‑28, 1995.
*Keynote Speaker and Session Chair, International Symposium on Polarization Analysis and Applications to Device Technology, Yokohama, Japan, June 12-14, 1996.
*Member of the Program Committee, Second International Conference on Spectroscopic Ellipsometry, Charleston, South Carolina, May 12-15, 1997.
*Member of the Program Committee, Session Chair, and Invited Speaker, Polarization Measurement, Analysis, and Remote Sensing II, Denver, Colorado, July 19-21, 1999.
*Member of the Program Committee, Polarization Measurement, Analysis, and Remote Sensing III, San Diego, California, July 30 - August 4, 2000.
*Member of the Program Committee, Polarization Analysis and Measurement IV, San Diego, California, July 29 - August 3, 2001.
*Member of the Program Committee, Polarization Measurement, Analysis, and Applications V, Seattle, Washington, July 7-11, 2002.
*Member of the Program Committee and Session Chair, Third International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 6-11. 2003.
*Attended the TWAS 9th General Conference in Beijing, China (October 15-19, 2003) as guest of the Chinese Academy of Sciences. Invited guest, Tsinghua University (Beijing) and Fudan University (Shanghai), October 20-22, 2003.
*Attended the Winter Leadership Conference of the Optical Society of America, Washington, D. C., February 2-4, 2005.
*Guest Scientist, First National Conference on Scientific Research, Cairo, Egypt, May 27-28, 2005, invited by the Egyptian Academy of Scientific Research and Technology.
*Invited guest, Einstein Symposium, part of the 2005 World-Year-of -Physics celebration, Bibliotheca Alexandrina, June 4-6, 2005, Alexandria, Egypt.
*Member of the International Steering Committee and Invited Keynote Speaker, JAPMED4, 4th Japanese-Mediterranean Workshop on Applied Electromagnetic Engineering for Magnetic, Superconducting, and Nano Materials, El Gezireh Hotel, Cairo, Egypt, September 17-20, 2005.
*Attended the Winter Leadership Conference of the Optical Society of America, Washington, D. C., February 1-3, 2006.
*Attended the 10th General Conference of the Academy of Sciences of the Developing World (TWAS), Angra dos Reis, Brazil, September 2 – 6, 2006 as a guest of the Brazilian Academy of Sciences.