APPENDIX I
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1. Azzam, R. M. A., and Bashara, N.M., "Unified Analysis of Ellipsometry Errors Due to Imperfect Components, Cell‑Window Birefringence, and Incorrect Azimuth Angles," J. Opt. Soc. Am. 61, 600‑607 (1971).
2. Azzam, R. M. A. , and Bashara, N.M., "General Treatment of the Effect of Cell Windows in Ellipsometry," J. Opt. Soc. Am. 61, 773‑776 (1971).
3. Azzam, R. M. A., and Bashara, N.M., "Calibration of Ellipsometer Divided Circles," J. Opt. Soc. Am. 61, 1118 (1971).
4. Azzam, R. M. A., and Bashara, N.M., "Specimen Coherent Scattering and and Compensator Defects in Ellipsometry," J. Opt. Soc. Am. 61, 1236‑1239 (1971).
5. Azzam, R. M. A., and Bashara, N.M., "Ellipsometry with Imperfect Components Including Incoherent Effects," J. Opt. Soc. Am. 61, 1380‑1391 (1971).
6. Azzam, R. M. A., and Bashara, N.M., "Response of an Optical System to Polarization‑Modulated Incident Light," Opt. Commun. 4, 203‑204 (1971).
7. Azzam, R. M. A., and Bashara, N.M., "Equi‑Azimuth and Equi‑ Ellipticity Contour Charts for Ellipsometry," Surface Sci. 30, 101‑108 (1972).
8. Azzam, R. M. A., and Bashara, N.M. , "Polarization Transfer Function of an Optical System as a Bilinear Transformation," J. Opt. Soc. Am. 62, 222‑229 (1972).
9. Azzam, R. M. A., and Bashara, N.M., "Ellipsometric Measurement of the Polarization Transfer Function of an Optical System," J. Opt. Soc. Am. 62, 336‑340 (1972).
10. Azzam, R. M. A. and Bashara, N.M., "Spacing of the Multiple Nulls in Generalized Ellipsometry," Opt. Commun. 5, 5‑9 (1972).
11. Azzam, R. M. A., and Bashara, N.M., "Choice of Compensator Azimuth and Position in Ellipsometry," J. Opt. Soc. Am. 62, 700‑701 (1972).
12. Azzam, R. M. A., and Bashara, N.M., "Polarization Characteristics of Scattered Radiation from a Diffraction Grating by Ellipsometry with Application to Surface Roughness," Phys. Rev. B 5, 4721‑4729 (1972).
13. Azzam, R. M. A., and Bashara, N.M., "The Effect of an Optical System in the Complex‑Plane and Poincaré‑Sphere Representations," Opt. Commun. 5, 319‑322 (1972).
14. Azzam, R. M. A., and Bashara, N.M., "Mechano‑Optic Polarization Modulator Using a Reflection Diffraction Grating," Appl. Phys. Lett. 21, 222‑224 (1972).
15. Azzam, R. M. A., and Bashara, N.M., "Analogy between Linear Optical Systems and Linear Two‑Port Electrical Networks," Appl. Opt. 11, 2210‑2214 (1972).
16. Azzam, R. M. A., and Bashara, N.M., "Bilinear Transformation of Polarization," J. Opt. Soc. Am. 62, 1239 (1972).
17. Azzam, R. M. A., and Bashara, N.M., "Simplified Approach to the Propagation of Polarized Light in Anisotropic Media ‑ Application to Liquid Crystals," J. Opt. Soc. Am. 62, 1252‑1257 (1972).
18. Azzam, R. M. A., and Bashara, N.M., "Generalized Ellipsometry for Surfaces with Directional Preference ‑ Application to Diffraction Gratings," J. Opt. Soc. Am. 62, 1521‑1523 (1972).
19. Azzam, R. M. A., and Bashara, N.M., "Loci of Invariant‑Azimuth and Invariant‑Ellipticity Polarization States of an Optical System," Appl. Opt. 12, 62‑67 (1973).
20. Azzam, R. M. A., Bundy, T.L., and Bashara, N.M. "The Fixed‑Polarizer Nulling Scheme in Generalized Ellipsometry," Opt. Commun. 7, 110‑115 (1973).
21. Azzam, R. M. A., and Bashara, N.M., "Separability of Amplitude, Phase, and Polarization Information in the Jones Calculus," Opt. Commun. 7, 317‑319 (1973).
22. Azzam, R. M. A., Merrill, B.E., and Bashara, N.M., "Trajectories Describing the Evolution of Polarized Light in Homogeneous Anisotropic Media and Liquid Crystals," Appl. Opt. 12, 764‑771 (1973).
23. Azzam, R. M. A., and Bashara, N.M., "Polarization‑Dependent Intensity Transmittance of an Optical System," Appl. Phys. 1, 203‑212 (1973).
24. Azzam, R. M. A., and Bashara, N.M., "New Properties of the Complex‑Plane Representation of Polarization," Appl. Phys. 2, 59‑ 61 (1973).
25. Azzam, R. M. A., and Bashara, N.M., "Parametric Equation for the Locus of Invariant‑Ellipticity States of an Optical System," Appl. Opt. 12, 2545‑2547 (1973).
26. Azzam, R. M. A., and Bashara, N.M., "Application of Generalized Ellipsometry to Anisotropic Crystals," J. Opt. Soc. Am. 64, 128‑132 (1974).
27. Azzam, R. M. A., and Bashara, N.M., "Average Polarization of Partially Polarized Light," J. Opt. Soc. Am. 64, 398‑399 (1974).
28. Merrill, B.E., Azzam, R. M. A., and Bashara, N.M., "Numerical Solution for the Evolution of the Ellipse of Polarization in Inhomogeneous Anisotropic Media," J. Opt. Soc. Am. 64, 731‑733 (1974).
29. Azzam, R. M. A., and Bashara, N.M., "Determination of the Ratio of Complex Eigenvalues of an Optical System with Known Eigenpolarizations by Ellipsometry," Optica Acta 21, 497‑507 (1974).
30. Azzam, R. M. A., and Bashara, N.M., "Analysis of Systematic Errors in Rotating‑Analyzer Ellipsometers," J. Opt. Soc. Am. 64, 1459‑1469 (1974).
31. Azzam, R. M. A., Zaghloul, A.‑R.M., and Bashara, N.M., "Ellipsometric Function of a Film‑Substrate System: Applications to the Design of Reflection‑Type Optical Devices and to Ellipsometry," J. Opt. Soc. 65, 252‑260 (1975).
32. Azzam, R. M. A., and Bashara, N.M., "Application of Generalized Ellipsometry to Anisotropic Crystals," J. Opt. Soc. Am. 65, 462 (1975).
33. Azzam, R. M. A., "Polar Curves for Transmission Ellipsometry," Opt. Commun. 14, 145‑147 (1975).
34. Zaghloul, A.‑R.M., Azzam, R. M. A., Bashara, N.M., "An‑Angle‑of‑Incidence Tunable Si02‑Si (Film‑Substrate) Reflection Retarder for the UV Mercury Line λ = 2537 Å," Opt Commun. 14, 260‑262 (1975).
35. Azzam, R. M. A., and Krueger, J. A., "Tuning a Babinet‑Soleil Compensator for Exact Quarter‑Wave Retardation in an Ellipsometer," J. Phys. E: Sci. Instrum. 8, 445‑446 (1975).
36. Azzam, R. M. A., Elshazly‑Zaghloul, M., and Bashara, N. M., "Combined Reflection and Transmission Thin‑Film Ellipsometry: A Unified Linear Analysis," Appl. Opt. 14, 1652‑1663 (1975).
37. Bashara, N. M., and Azzam, R. M. A., "Ellipsometry: A Technique for Characterization of Surfaces and Interfaces in Light‑Transmitting Ambients," J. Vac. Sci. Technol. 12, 887‑890 (1975).
38. Zaghloul, A.‑R. M., Azzam, R. M. A., and Bashara, N. M., "Design of Film‑Substrate Single‑Reflection Retarders," J. Opt. Soc. Am. 65, 1043‑1049 (1975).
39. Azzam, R. M. A., Zaghloul, A.‑R. M., and Bashara, N. M., "Polarizer‑Surface‑Analyzer Null Ellipsometry for Film‑Substrate Systems," J. Opt. Soc. Am. 65, 1464‑1471 (1975).
40. Azzam, R. M. A., Zaghloul, A.-R. M., and Bashara, N. M., "Design of Film‑Substrate Single‑Reflection Linear Partial Polarizers," J. Opt. Soc. Am. 65, 1472‑1474 (1975).
41. Azzam, R. M. A., "AIDER: Angle‑of‑Incidence‑Derivative Ellipsometry and Reflectometry," Opt. Commun. 16, 153‑156 (1976).
42. Azzam, R. M. A., "Biomedical Applications of Ellipsometry," 1976 Region V IEEE Conference Digest, A. B. Buckman, Ed. (IEEE Press, New York, 1976), 194‑197.
43. Azzam, R. M. A., "Oscillating‑Analyzer Ellipsometer," Rev. Sci. Instrum. 47, 624‑628 (1976).
44. Azzam, R. M. A., "Modulated Generalized Ellipsometry," J. Opt. Soc. Am. 66, 520‑524 (1976).
45. Azzam, R. M. A., "Frequency‑Mixing Detection (FMD) of Polarization‑Modulated Light," J. Opt. Soc. Am. 66, 735‑739 (1976).
46. Azzam, R. M. A., "A Perspective on Ellipsometry," Surface Sci. 56, 6‑18 (1976).
47. Azzam, R. M. A., "Use of a Light Beam to Probe the Cell Surface in Vitro," Surface Sci. 56, 126‑133 (1976).
48. Azzam, R. M. A., "Alternate Arrangement and Analysis of Systematic Errors for Dynamic Photometric Ellipsometers Employing an Oscillating‑Phase Retarder," Optik 45, 209‑218 (1976).
49. Zaghloul, A.‑R. M., Azzam, R. M. A., and Bashara, N. M., "Inversion of the Nonlinear Equations of Reflection Ellipsometry on Film‑Substrate Systems," Surface Sci. 56, 87‑96 (1976).
50. Elshazly‑Zaghloul, M., Azzam, R. M. A., and Bashara, N. M., "Explicit Solution for the Optical Properties of a Uniaxial Crystal in Generalized Ellipsometry," Surface Sci. 56, 281‑292 (1976).
51. Azzam, R. M. A., "Two‑Reflection Null Ellipsometer without a Compensator," J. Phys. E: Sci. Instrum. 9, 569‑572 (1976).
52. Azzam, R. M. A., "An Entoptic Phenomenon and a Theory for its Explanation," Optik 45, 499‑502 (1976).
53. Azzam, R. M. A., "PIE: Perpendicular‑Incidence Ellipsometry ‑ Application to the Determination of the Optical Properties of Uniaxial and Biaxial Absorbing Crystals," Opt. Commun. 19, 122‑ 124 (1976).
54. Confer, D. L., Azzam, R. M. A., and Bashara, N. M., "Ellipsometer Nulling: Convergence and Speed," Appl. Opt. 15, 2568‑2575 (1976).
55. Azzam, R. M. A., "Use of Different Periodic Analyzers for the Frequency‑Mixing Detection of Polarization‑Modulated Light," Proc. SPIE 88, 11‑18 (1976).
56. Azzam, R. M. A. "Ellipsometry as a Tool for Monitoring Molecular and Cellular Biological Processes in Vitro," Proc. SPIE 88, 84‑88 (1976).
57. Azzam, R. M. A., "NIRSE: Normal‑Incidence Rotating‑Sample Ellipsometer," Opt. Commun. 20, 405‑408 (1977).
58. Azzam, R. M. A., "Polarization Orthogonalization Properties of Optical Systems," Appl. Phys. 13, 281‑285 (1977).
59. Azzam, R. M. A., Rigby, P., and Krueger, J. A., "Kinetics of Protein Adsorbtion and Immunological Reactions at a Liquid/Solid Interface by Ellipsometry," Phys. Med. Biol. 22, 422‑ 430 (1977).
60. Zaghloul, A.‑R. M., and Azzam, R. M. A., "SiO2‑Si Film‑Substrate Reflection Polarizers for Different Mercury Spectral Lines," Appl. Opt. 16, 1488‑1489 (1977).
61. Azzam, R. M. A., and Zaghloul, A.‑R. M., "Polarization‑Independent Reflectance Matching (PIRM) ‑ A Technique for the Determination of the Refractive Index and Thickness of Transparent Films," J. Optics (Paris) 8, 201‑205 (1977).
62. Azzam, R. M. A., and Zaghloul, A.‑R. M., "Principal Angle, Principal Azimuth, and Principal‑Angle Ellipsometry of Film‑Substrate Systems," J. Opt. Soc. Am. 67, 1058‑1065 (1977).
63. Azzam, R. M. A., "Hybrid Null‑Photometric Ellipsometer Using Sinusoidal Optical Rotation," Optik 48, 279‑288 (1977).
64. Zaghloul, A.‑R. M. and Azzam, R. M. A., "Single‑Element Rotating‑Polarizer Ellipsometer," J. Opt. Soc. Am. 67, 1286‑ 1287 (1977).
65. Azzam, R. M. A., "Frequency‑Mixing Detection of Polarization‑Modulated Light Using Different Periodic Analyzers," Opt. Eng. 16, 513‑517 (1977).
66. Azzam, R. M. A., "Return‑Path Ellipsometry and a Novel Normal‑Incidence Null Ellipsometer (NINE)," Optica Acta 24, 1039‑ 1049 (1977).
67. Azzam, R. M. A., "Photopolarimeter Using Two Modulated Optical Rotators," Optics Lett. 1, 181‑183 (1977).
68. Azzam, R. M. A., "Fourier Photoellipsometers and Photopolarimeters Based on Modulated Optical Rotation," Proc. SPIE 112, 54‑57 (1977).
69. Azzam, R. M. A., and Zaghloul, A.‑R. M., "Determination of the Refractive Index and Thickness of a Transparent Film on a Transparent Substrate from the Angles of Incidence of Zero Reflection‑Induced Ellipticity," Opt. Commun. 24, 351‑354 (1978).
70. Azzam, R. M. A., "Oblique and Normal-Incidence Photometric Return‑Path Ellipsometers for Isotropic and Anisotropic Surfaces," J. Optics (Paris) 9, 131‑134 (1978).
71. Zaghloul, A.‑R. M., Azzam, R. M. A., and Bashara, N. M., "SiO2‑Si Film‑Substrate Single‑Reflection Retarders for Different Mercury Spectral Lines," Opt. Eng. 17, 180‑184 (1978).
72. Azzam, R. M. A., Rigby, P. G., and Krueger, J. A., "On the Estimation and Interpretation of Film Thickness in an Ellipsometric Protein‑Adsorption Experiment," Optik 50, 249‑250 (1978).
73. Azzam, R. M. A., "Generalized Ellipsometry Based on Azimuth Measurements Alone," J. Opt. Soc. Am. 68, 514‑518 (1978).
74. Azzam, R. M. A., "Simulation of Mechanical Rotation by Optical Rotation: Application to the Design of a New Fourier Photopolarimeter," J. Opt. Soc. Am. 68, 518‑521 (1978).
75. Azzam, R. M. A., "Photoelectronic Phase and Frequency Modulation," Proc. IEEE 66, 606‑607 (1978).
76. Azzam, R. M. A., "Photo‑Optical Waveform Generation," Optik 52, 87‑89 (1978).
77. Azzam, R. M. A., "Photopolarimetric Measurement of the Mueller Matrix by Fourier Analysis of a Single Detected Signal," Opt. Lett. 2, 148‑150 (1978).
78. Azzam, R. M. A., "A Simple Fourier Photopolarimeter with Rotating Polarizer and Analyzer for Measuring Jones and Mueller Matrices," Opt. Commun. 25, 137‑140 (1978).
79. Azzam, R. M. A., "Consequences of Light Reflection at the Interface Between Two Transparent Media Such That the Angle of Refraction is 45o," J. Opt. Soc. Am. 68, 1613‑1615 (1978).
80. Azzam, R. M. A., "Propagation of Partially Polarized Light Through Anisotropic Media with or without Depolarization: A Differential 4x4 Matrix Calculus," J. Opt. Soc. Am. 68, 1756‑ 1767 (1978).
81. Azzam, R. M. A., "Measurement of the Stokes Parameters of Light: A Unified Analysis of Fourier Photopolarimetry," Optik 52, 253‑256 (1979).
82. Azzam, R. M. A., "On the Reflection of Light at 45 Angle of Incidence," Optica Acta 26 113‑115, 301 (1979).
83. Azzam, R. M. A., "Optical Detection of Cell‑Surface Changes Associated with Malignant Transformations in Vitro," Microscop. Acta 81, 313‑316 (1979).
84. Azzam, R. M. A., "Reflection of an Electromagnetic Plane Wave with 0 or π Phase Shift at the Surface of an Absorbing Medium," J. Opt. Soc. Am. 69, 487‑488 (1979).
85. Azzam, R. M. A., "Transformation of Fresnel's Interface Reflection and Transmission Coefficients between Normal and Oblique Incidence," J. Opt. Soc. Am. 69, 590‑596 (1979).
86. Azzam, R. M. A., "Relations between Amplitude Reflectances and Phase Shifts of the p and s Polarizations when Electromagnetic Radiation Strikes Interfaces between Transparent Media," Appl. Opt. 18, 1884‑1886 (1979).
87. Azzam, R. M. A., "Direct Relation between Fresnel's Interface Reflection Coefficients for the Parallel and Perpendicular Polarizations," J. Opt. Soc. Am. 69, 1007‑1016 (1979).
88. Azzam, R. M. A., "Equalization of Reflectance of Paralled‑Polarized Electromagnetic Plane Waves at Normal and Oblique Incidence of Interfaces between Transparent Media and its Use for Measurement of the Dielectric Constant," Appl. Phys. 20, 193‑195 (1979).
89. Azzam, R. M. A., "Light‑Reflection Liquid‑Level Sensor," IEEE Trans. Instr. Measur. 29, 113‑115 (1980).
90. Azzam, R. M. A., "Conjugate Interfaces: Interfaces between Transparent Media of the Same Reflection Coefficient for the Parallel Polarization at the Same Angle of Incidence," Opt. Acta 27, 419‑428 (1980).
91. Azzam, R. M. A., "Fresnel Coefficients of Light Reflection at Interfaces between Transparent Media: A Complete Picture of their Behavior," Optik 56, 401‑412 (1980).
92. Elshazly‑Zaghloul , M., and Azzam, R. M. A., "Inversion of the Nonlinear Equations of Reflection Ellipsometry for Uniaxial Crystals in Symmetrical Orientations," J. Opt. Soc. Am. 70, 880‑883 (1980).
93. Azzam, R. M. A., "Ellipsometry of Transparent Films on Transparent Substrates," Surface Sci. 96, 67‑80 (1980).
94. Zaghloul, A.‑R. M., and Azzam, R. M. A., "Single‑Element Rotating-Polarizer Ellipsometer: Psi Meter," Surface Sci. 96, 168‑ 173 (1980).
95. Davis, R. B., Azzam, R. M. A., and Holtz, G., "Ellipsometric Observations of Surface Adsorption and Molecular Interactions of Native and Modified Fibrinogen and Factor VIII," Surface Sci. 96, 539‑554 (1980).
96. Azzam, R. M. A., "Modulated‑Mueller‑Matrix Photopolarimetry (MMMP): A Technique for the Study of Elastic Light Scattering by Depolarizing Temporally Modulated Media and Surfaces," Opt. Lett. 5, 303‑305 (1980).
97. Azzam, R. M. A., "Determination of the Optic Axis and Optical Properties of Absorbing Uniaxial Crystals by Reflection Perpendicular‑Incidence Ellipsometry on Wedge Samples," Appl. Opt. 19, 3092‑3095 (1980).
98. Azzam, R. M. A., "Mapping of Fresnel's Interface Reflection Coefficients between Normal and Oblique Incidence: Results for the Parallel and Perpendicular Polarizations at Several Angles of Incidence," Appl. Opt. 19, 3361‑3369 (1980).
99. Azzam, R. M. A., "Perpendicular‑Incidence Null Ellipsometry of Surfaces with Arbitrary Anisotropy," Opt. Eng. 20, 58‑61 (1981).
100. Azzam, R. M. A., "Measurement of the Ratio of Complex Principal Reflection coefficients of Optically Isotropic and Anisotropic Surfaces using Birefringence‑Modulation Return‑Path Ellipsometry," Optik 58, 251‑257 (1981).
101. Azzam, R. M. A., "Measurement of the Jones Matrix of an Optical System by Return‑Path Null Ellipsometry," Optica Acta 28, 795‑800 (1981).
102. Azzam, R. M. A., "Perpendicular‑Incidence Photometric Ellipsometry (PIPE) of Surfaces with Arbitrary Anisotropy," J. Opt. (Paris) 12, 317‑321 (1981).
103. Azzam, R. M. A., "Ellipsometric Configurations and Techniques," Proc. SPIE 276, 180‑187 (1981).
104. Azzam, R. M. A. and Zaghloul, A.‑R. M., "Characteristics of Polarized Light Reflection from the SiO2‑Si Film‑Substrate System," Proc. SPIE 276, 242‑248 (1981).
105. Azzam, R. M. A., "Backscattering Mueller‑Matrix Photopolarimeter with Nonreciprocal Polarizing‑Analyzing Optics," Opt. Lett. 6, 417‑418 (1981).
106. Azzam, R. M. A., "Polarization‑Preserving, Single‑Layer‑Coated, Laser Biconical Reflectors," in Proceeding of the International Conference LASERS '80, C. B. Collins, Ed. (STS Press, McLean, Virginia, 1981), pp. 610‑614.
107. Azzam, R. M. A., "Explicit Determination of Thickness of a Transparent Film on a Transparent Substrate from Angles of Incidence of Equal p and s Reflectivities," Appl. Opt. 20, 3274‑ 3275 (1981).
108. Azzam R. M. A., "Contours of Constant Principal Angle and Constant Principal Azimuth in the Complex Plane," J. Opt. Soc. Am. 71, 1523‑1528 (1981).
109. Zaghloul, A.‑R. M. and Azzam, R. M. A., "Constant‑Psi Constant‑Delta Contour Maps: Applications to Ellipsometry and to Reflection‑Type Optical Devices," Appl. Opt. 21, 739‑743 (1982).
110. Azzam, R. M. A., "Division‑of‑Amplitude Photopolarimeter (DOAP) for the Simultaneous Measurement of All Four Stokes Parameters of Light," Optica Acta 29, 685‑689 (1982).
111. Azzam, R. M. A., "Displacement of a Monochromatic Light Beam Parallel to itself without Change of Polarization," Opt. Lett. 7, 80‑82 (1982).
112. Azzam, R. M. A., "Elastic Light Scattering Mueller‑Matrix Photopolarimetry," in Proceeding of the International Conference LASERS '81, C. B. Collins, Ed. (STS Press, McLean, Virginia, 1982), pp. 554‑559.
113. Azzam, R. M. A., "Interfaces between Transparent Media that Allow Total Reflection or Total Refraction of Parallel‑Polarized Light at the Same Angle of Incidence," Opt. Commun. 41, 223‑225 (1982).
114. Elshazly‑Zaghloul, M. and Azzam, R. M. A., "Brewster and Pseudo‑Brewster Angles of Uniaxial Crystal Surfaces and their Use for Determination of Optical Properties," J. Opt. Soc. Am. 72,, 657‑661 (1982); Erratum, J. Opt. Soc. Am. A 6, 607 (1989).
115. Azzam, R. M. A., "Stationary Property of Normal‑Incidence Reflection from Isotropic Surfaces," J. Opt. Soc. Am. 72, 1187‑ 1189 (1982).
116. Azzam, R. M. A., "Scheme to Polarization‑Correct a Waxicon," Appl. Opt. 21. 3067‑3068 (1982).
117. Azzam, R. M. A. and Khan, M. E. R., "Polarization‑Preserving Single‑Layer‑Coated Beam Displacers and Axicons," Appl. Opt. 21, 3314‑3322 (1982).
118. Azzam, R. M. A., "Explicit Determination of the Complex Refractive Index of an Absorbing Medium from Reflectance Measurements at and Near Normal Incidence," J. Opt. Soc. Am. 72, 1439‑1440 (1982).
119. Azzam, R. M. A., "The Change of Polarization that Accompanies Normal Incidence Reflection from a Passive Isotropic Surface," Optik 63, 37‑41 (1982).
120. Azzam, R. M. A. and Khan, M. E. R., "Equalization of the TE and TM Complex Eigenvalues of 90o‑Roof‑Top Reflectors and Waxicons Using Thin‑Film Dielectric Coatings," Opt. Commun. 44. 223‑228 (1983).
121. Azzam, R. M. A. and Khan, M. E. R., "Single‑Reflection Film‑Substrate Halfwave Retarders with Nearly Stationary Reflection Properties over a Wide Range of Incidence Angles," J. Opt. Soc. Am. 73, 160‑166 (1983).
122. Azzam, R. M. A. and Khan, M. E. R., "Complex Reflection Coefficients for the Parallel and Perpendicular Polarizations of a Film‑Substrate System," Appl. Opt. 22, 253‑264 (1983).
123. Azzam, R. M. A., "Angle‑of‑Incidence Derivatives of the Complex Parallel and Perpendicular Reflection Coefficients and their Ratio for a Film‑Substrate System," Optica Acta 30, 1113‑1124 (1983).
124. Azzam, R. M. A., "Grazing‑Incidence Differential Reflectance Method for Explicit Determination of Complex Dielectric Function of an Isotropic Absorbing Medium," Rev. Sci. Instrum. 54, 853‑855 (1983).
125. Azzam, R. M. A., "Maximum Minimum Reflectance of Parallel‑Polarized Light at Interfaces between Transparent and Absorbing Media," J. Opt. Soc. Am. 73, 959‑962 (1983).
126. Azzam, R. M. A., "ZnS‑Ag Film‑Substrate Parallel‑Mirror Beam Displacers that Maintain Polarization of 10.6 μm Radiation over a Wide Range of Incidence Angles," Infrared Physics 23, 195‑ 197 (1983).
127. Azzam, R. M.A., "Simple and Direct Determination of Complex Refractive Index and Thickness of Unsupported or Embedded Thin Films by Combined Reflection and Transmission Ellipsometry at 45 Angle of Incidence," J. Opt. Soc. Am. 73, 1080‑1082 (1983).
128. Azzam, R. M. A. and Kemp, R. H., Jr., "AIDER Functions of Stratified and Inhomogeneous Light‑Reflecting Structures," Surface Sci. 135, 261‑275 (1983).
129. Azzam, R. M. A., "Explicit Equations for the Second Brewster Angle of an Interface between a Transparent and an Absorbing Medium," J. Opt. Soc. Am. 73, 1211‑1212 (1983).
130. Azzam, R. M. A. and Khan, M. E. R., "MgF2‑Al Film‑Substrate Half‑Wave Retarder for 0.6328 μm He‑Ne Laser Light," in Proceedings of the International Conference LASERS '82, R. C. Powell, Ed. (STS Press, McLean, Virginia, 1983), pp. 708‑712.
131. Azzam, R. M. A. and Thonn, T. F., "Pseudo‑Brewster and Second‑Brewster Angles of an Absorbing Substrate Coated by a Transparent Thin Film," Appl. Opt. 22, 4155‑4165 (1983).
132. Azzam, R. M. A., "Ellipsometry of Unsupported and Embedded Thin Films," J. Physique (Paris) 44, C10, 67‑70 (1983).
133. Azzam, R. M. A., "Theory, Implementation, and Applications of AIDER," J. Physique (Paris) 44, C10, 71‑74 (1983).
134. Azzam, R. M. A., "Inverting the Ratio of the Complex Parallel and Perpendicular Reflection Coefficients of an Absorbing Substrate Using a Transparent Thin‑Film Coating," J. Opt. Soc. Am. A 1, 699‑702 (1984).
135. Azzam, R. M. A. and Thonn, T. F., "Three‑Reflection Polarizers Using Dielectric‑Coated Metallic Mirrors," Proc. SPIE 464, 80‑87 (1984).
136. Azzam, R. M. A. and Perilloux, B. E., "Polarized‑Light Techniques for Generating Electrical Signals of Controllable Waveform," Proc. SPIE 464, 88‑95 (1984).
137. Azzam, R. M. A., "Division‑of‑Wavefront Polarizing Beam Splitter and Half‑Shade Device using Dielectric Thin Film on Dielectric Substrate," Appl. Opt. 23, 1296‑1298 (1984).
138. Perilloux, B.E. and Azzam, R. M. A., "Low‑Distortion Electro‑Optic Intensity‑Modulation System with Optical Feedback," Opt. Commun. 50, 303‑306 (1984).
139. Thonn, T. F. and Azzam, R. M. A., "Three‑Reflection Halfwave and Quarterwave Retarders using Dielectric‑Coated Metallic Mirrors," Appl. Opt. 23, 2752‑2759 (1984).
140. Arndt, D.P., Azzam, R. M. A., Bennett, J.M., Borgogno, J.P., Carniglia, C.K., Case, W.E., Dobrowolski, J.A., Gibson, U.J., Hart, T. Tuttle Ho, F.C., Hodgkin, V.A., Klapp, W.P., Macleod, H.A., Pelletier, E. Purvis, M.K., Quinn, D.M., Strome, D.H., Swenson, R., Temple, P.A., and Thonn, T.F., "Multiple Determination of the Optical Constants of Thin Film Coating Materials," Appl. Opt. 23, 3571‑3596 (1984).
141. Thonn, T.F. and Azzam, R. M. A., "Multiple‑Reflection Polarizers using Dielectric‑Coated Metallic Mirrors," Opt. Eng. 24, 202‑206 (1985).
142. Azzam, R. M. A., "Extinction of the p and s Polarizations of a Wave upon Reflection at the Same Angle from a Transparent Film on an Absorbing Substrate: Applications to Parallel‑Mirror Crossed Polarizers and a Novel Integrated Polarimeter," J. Opt. Soc. Am. A 2, 189‑197 (1985).
143. Azzam, R. M. A., "Single‑Layer Antireflection Coatings on Absorbing Substrates for the Parallel and Perpendicular Polarizations at Oblique Incidence," Appl. Opt. 24, 513‑518 (1985).
144. Azzam, R. M. A. and Javily, K., "Antireflecting and Polarizing Transparent Bilayer Coatings on Absorbing Substrates at Oblique Incidence," Appl. Opt. 24, 519‑526 (1985).
145. Azzam, R. M. A., "Simultaneous Reflection and Refraction of Light without Change of Polarization by a Single‑Layer‑Coated Dielectric Surface", Opt. Lett. 10, 107‑109 (1985).
146. Azzam, R. M. A., "Variable‑Reflectance Thin‑Film Polarization‑ Independent Beam Splitters for 0.6328‑ and 10.6 μm Laser Light," Opt. Lett. 10, 110‑112 (1985).
147. Azzam, R. M. A., "Explicit Equations for the Polarizing Angles of a High‑Reflectance Substrate Coated by a Transparent Thin Film," J. Opt. Soc. Am. A 2, 480‑482 (1985).
148. Thonn. T.F. and Azzam, R. M. A., "Determination of the Optical Constants and Thickness Profile of a Tapered Inconel Film by Reflection Ellipsometry," Thin Solid Films 127, 215‑222 (1985).
149. Azzam, R. M. A., and Perilloux, B.E., "Constraint on the Optical Constants of a Film‑Substrate System for Operation as an External‑Reflection Retarder at a Given Angle of Incidence," Appl. Opt. 24, 1171‑1179 (1985).
150. Azzam, R. M. A., and Perilloux, B.E., "Equalization of the Complex Reflection Coefficients for the Parallel and Perpendicular Polarizations of an Absorbing Substrate Coated by a Transparent Thin Film," Optica Acta 32, 767‑777 (1985).
151. Azzam, R. M. A., "Beam Splitters for the Division‑of‑Amplitude Photopolarimeter (DOAP)," Optica Acta 32, 1407‑1412 (1985).
152. Azzam, R. M. A., "Arrangement of Four Photodetectors for Measuring the State of Polarization of Light," Opt. Lett. 10, 309‑ 311 (1985).
153. Azzam, R. M. A., "Rotating‑Detector Ellipsometer for Measurement of the State of Polarization of Light, "Opt. Lett. 10, 427‑429 (1985).
154. Azzam, R. M. A., "Two‑Detector Ellipsometer," Rev. Sci. Instrum. 56, 1746‑1748 (1985).
155. Azzam, R. M. A., "Reflective Thin‑Film Device for Generating Spatial Binary Patterns of Orthogoral Circular Polarization States," Opt. Commun. 55, 297‑299 (1985).
156. Azzam, R. M. A. and Javily, K., "Total Refraction at Oblique Incidence by a Transparent Bilayer Coating a High‑Index Transparent or Absorbing Substrate," Appl. Opt. 24 4454‑4459 (1985).
157. Javily, K. and Azzam, R. M. A., "Coating a Transparent or Absorbing Substrate by a Transparent Thin Film for Minimum Reflectance of Unpolarized Light at Oblique Incidence," Optik 72, 75‑78 (1986).
158. Azzam, R. M. A., "Mueller‑Matrix Measurement using the Four‑Detector Photopolarimeter," Opt. Lett. 11, 270‑272 (1986).
159. Azzam, R. M. A., "Relationship between the p and s Fresnel Reflection Coefficients of an Interface Independent of Angle of Incidence," J. Opt. Soc. Am. A 3, 928‑929 (1986).
160. Azzam, R. M. A., "Thin‑Film Beam Splitter that Reflects Light as a Half‑wave Retarder and Transmits it without Change of Polarization: Application to a Michelson Interferometer," J. Opt. Soc. Am. A 3, 1803‑1808 (1986).
161. Azzam, R. M. A., "Ellipsometric Methods of Characterization of Optical Thin Films," Proc. SPIE 652, 198‑201 (1986).
162. Azzam, R. M. A. and Thonn, T.F., "Efficient Infrared Reflection Polarizers Using Transparent High‑Index Films on Transparent Low‑Index Substrates," Proc. SPIE 652, 326‑332 (1986).
163. Azzam, R. M. A., "Response of the Rotating‑Detector Ellipsometer for Incident Partially Polarized Light," Appl. Opt 25, 4224‑4225 (1986).
164. Azzam, R. M. A., "Polarizing Beam Splitters for Infrared and Millimeter Waves Using Single‑Layer‑Coated Dielectric Slab or Unbacked Films," Appl. Opt. 25, 4225‑4227 (1986).
165. Azzam, R. M. A., "Coating a Transparent Substrate by a Transparent Thin Film for Equal p and s Reflectances: All Possible Solutions," Thin Solid Films 147, 17‑24 (1987).
166. Azzam, R. M. A., Bu‑Habib, E., Casset, J., Chassaing, G. and Gravier, P., "Antireflection of an Absorbing Substrate by an Absorbing Thin Film," Appl. Opt. 26 719‑722 (1987).
167. Azzam, R. M. A., "Angular Sensitivity of Brewster‑Angle Reflection Polarizers: An Analytical Treatment," Appl. Opt. 26, 2847‑2850 (1987).
168. Azzam, R. M. A., "Integrated Polarimeters Based on Anisotropic Photodetectors," Opt. Lett. 12, 555‑557 (1987).
169. Azzam, R. M. A., "In‑Line Light‑Saving Photopolarimeter and its Fiber‑Optic Analog," Opt. Lett. 12, 558‑560 (1987).
170. Azzam, R. M. A. and Habli, M.A., "Constraint on the Optical Constants of a Transparent Film on an Absorbing Substrate for Inversion of the Ratio of Complex p and s Reflection Coefficients at a Given Angle of Incidence," Appl. Opt. 26, 4717‑4721 (1987).
171. Azzam, R. M. A., Masetti, E., Elminyawi, I.M., and Grosz, F.B., "Construction, Calibration, and Testing of a Four‑Detector Photopolarimeter," Rev. Sci. Instrum. 59, 84‑88 (1988).
172. Azzam, R. M. A., Elminyawi, I.M., and El‑Saba, A.M., "General Analysis and Optimization of the Four‑Detector Photopolarimeter," J. Opt. Soc. Am. A 5, 681‑689 (1988).
173. Azzam, R. M. A., "Single‑Layer‑Coated Optical Devices for Polarized Light," Thin Solid Films 163, 33‑41 (1988).
174. Azzam, R. M. A., "Integrated Photopolarimeters," Proc. SPIE 891, 42‑55 (1988).
175. Azzam, R. M. A., "Extrema of the Magnitude and Phase of a Complex Function of a Real Variable: Application to Attenuated Internal Reflection," J. Opt. Soc. Am. A 5, 1187‑1192 (1988).
176. Azzam, R. M. A., "Division‑of‑Wavefront Thin‑Film Beam Splitter for Generating Binary Patterns of Orthogonal Elliptical Polarization States," J. Opt. Soc. Am. A 5, 1576‑1580 (1988).
177. Azzam, R. M. A., and El‑Saba, A. M., "Reflectance of an Absorbing Substrate for Incident Light of Arbitrary Polarization: Appearance of a Secondary Maximum at Oblique Incidence," Appl. Opt. 27, 4034‑4037 (1988).
178. Azzam, R. M. A., "Binary Polarization Modulator: A Simple Device for Switching Light Polarization between Orthogonal States," Opt. Lett. 13, 701‑703 (1988).
179. Azzam, R. M. A., "Polarization‑Based Technique for Separating Copropagating Waves of Different Wavelengths," Opt. Commun. 68, 396‑398 (1988).
180. Habli, M. A., Azzam, R. M. A., and El‑Saba, A. M., "Single‑Layer Coating of One Mirror of a 90o‑Rooftop Reflector for Equal p and s Net Complex Reflection Coefficients," Opt. Commun. 69, 181‑184 (1989).
181. Azzam, R. M. A. and El‑Saba, A. M., "Maximum Rate of Change of the Differential Reflection Phase Shift with Respect to Angle of Incidence for Light Reflection at the Surface of an Absorbing Medium," Appl. Opt. 28, 1365‑1368 (1989).
182. Azzam, R. M. A., "Analytical Determination of the Complex Dielectric Function of an Absorbing Medium from Two Angles of Incidence of Minimum Parallel Reflectance," J. Opt. Soc. Am. A 6, 1213‑1216 (1989).
183. Azzam, R. M. A. and Lopez, A. G., "Accurate Calibration of the Four‑Detector Photopolarimeter with Imperfect Polarizing Optical Elements," J. Opt. Soc. Am. A 6, 1513‑1521 (1989).
184. Azzam, R. M. A. and Ugbo, E. E., "Contours of Constant Pseudo‑Brewster Angle in the Complex ε Plane and an Analytical Method for the Determination of Optical Constants," Appl. Opt. 28, 5222‑ 5228 (1989).
185. Nick, D. C., and Azzam, R. M. A., "Performance of an Automated Rotating‑Detector Ellipsometer," Rev. Sci. Instrum. 60, 3625‑3632 (1989).
186. Azzam, R. M. A., "Instrument Matrix of the Four‑Detector Photopolarimeter: Physical Meaning of its Rows and Columns and Constraints on its Elements," J. Opt. Soc. Am. A. 7, 87‑91 (1990).
187. Azzam, R. M. A. and Pentzke, F. J., "Extrema of the Absolute Value and Argument of a Complex Function of a Real Variable: Application to the Spectral Amplitude and Phase Response of Analog Filter Circuits," in IEEE Southeastcon '90 Proceedings (IEEE Catalog No. 90CH2883‑7, 1990), pp. 925‑928.
188. Azzam, R. M. A. and Lopez, A. G., "Precision Analysis and Low‑Light‑Level Measurements Using a Prototype Four‑Detector Photopolarimeter," Rev. Sci. Instrum. 61, 2063‑2068 (1990).
189. Azzam, R. M. A. and D. C. Nick, "Stokes‑Parameter Photopolarimeter Using an Optically or Mechanically Rotatable Two‑Detector Assembly," IEEE Trans. Instrum. Measur. 39, 722‑725 (1990).
190. Azzam, R. M. A., and Habli, M. A., "Coating a Transparent Substrate by a Transparent Thin Film to Produce a Given Transmission Differential Phase Retardance without Diattenuation for Obliquely Incident Monochromatic Light," Opt. Commun. 78, 315‑321 (1990).
191. Azzam, R. M. A., "Determination of the Complex Dielectric Function of an Unbacked or Embedded Thin Film by Grazing‑Incidence Reflection or Transmission Ellipsometry," Opt. Commun. 80, 103‑ 106 (1990).
192. Azzam, R. M. A., "Longitudinal Polarization‑Dependent Coupling of Light from an Optical Fiber to a Side‑Bonded Planar Proximity Detector: Application to Integrated Azimuthally Distributed Multi‑Detector Photopolarimeters," IEEE Photon. Tech. Lett. 2, 893‑895 (1990).
193. Azzam, R. M. A., "Transmission Ellipsometry on Transparent Unbacked or Embedded Thin Films with Application to Soap Films in Air," Appl. Opt. 30, 2801‑2806 (1991).
194. Azzam, R. M. A., "Arrangement of Two Reflective Photodetectors for Measuring All Four Stokes Parameters of Light," Rev. Sci. Instrum. 62, 2080‑2082 (1991).
195. Azzam, R. M. A., Giardina, K. A., and Lopez, A. G., "Conventional and Generalized Mueller‑Matrix Ellipsometry Using the Four‑Detector Photopolarimeter," Opt. Eng. 30, 1583‑1589 (1991).
196. Azzam, R. M. A., "Principal Linear Polarization States of an Optical System," J. Opt. Soc. Am. A 9, 147‑150 (1992).
197. Azzam, R. M. A., and Giardina, K. A., "Achieving a Given Reflectance for Unpolarized Light by Controlling the Incidence Angle and the Thickness of a Transparent Film on an Absorbing Substrate: Application to Energy Equipartition in the Four‑Detector Photopolarimeter," Appl. Opt. 31, 935‑942 (1992).
198. Azzam, R. M. A., "Limaçon of Pascal Locus of the Complex Refractive Indices of Interfaces with Maximally Flat Reflectance‑versus‑Angle Curves for Incident Unpolarized Light," J. Opt. Soc. Am. A. 9, 957‑963 (1992).
199. Azzam, R. M. A., "An Efficient Calibration Scheme for the Four‑Detector Photopolarimeter Using a Rotating Quarter‑Wave Retarder," in Direct and Inverse Methods in Radar Polarimetry, W.‑ M. Boerner et. al., Eds. (Kluwer Academic Publishers, Dordrecht, Holland, 1992), 809‑818.
200. Azzam, R. M. A., "Division‑of‑Amplitude Photopolarimeter Based on Conical Diffraction from a Metallic Grating," Appl. Opt. 31, 3574‑3576 (1992).
201. Azzam, R. M. A., "Diffraction Efficiency of a Grating as a Function of the State of Polarization of Incident Light," in Diffractive Optics: Design, Fabrication, and Applications Technical Digest, 1992 (Optical Society of America, Washington, D. C., 1992), Vol. 9, pp. 69‑71.
202. Azzam, R. M. A., and Habli, M. A., "Bilayer Coatings for Light Refraction without Change of Polarization," J. Mod. Opt. 39, 2255‑2263 (1992).
203. Azzam, R. M. A., and Giardina, K. A., "Polarization Analysis Based on Grating Conical Diffraction," SPIE Proc. 1746, 2‑13 (1992).
204. Azzam, R. M. A., and Angel, W. W., "Transparent Binary‑Thickness Coatings on Metal Substrates that Produce Binary Patterns of Orthogonal Elliptical Polarization States in Reflected Light," SPIE Proc. 1746, 157‑164 (1992).
205. Azzam, R. M. A., "High‑Efficiency Reflection Polarizers Based on Light Interference in a Buried Low‑Index (BLIND) layer in a High‑Index Substrate," SPIE Proc. 1746, 367‑374 (1992).
206. Azzam, R. M. A., "Chiral Thin Solid Films: Method of Deposition and Applications," Appl. Phys. Lett. 61, 3118‑3120 (1992).
207. Azzam, R. M. A. and Giardina, K. A., "Photopolarimeter Based on Planar Grating Diffraction," J. Opt. Soc. Am. A 10, 1190-1196 (1993).
208. Azzam, R. M. A., "Polarization Michelson Interferometer (POLMINT): Its Use for Polarization Modulation and Temporal Pulse Shearing," Opt. Commun. 98, 19‑23 (1993).
209. Azzam, R. M. A., "Multi‑Detector Photopolarimeters for Industrial Optical Sensing and Metrology," SPIE Proc. 1821, 270‑ 283 (1993).
210. Azzam, R. M. A., "Multichannel Polarization State Detectors for Time‑Resolved Ellipsometry," Thin Solid Films 234, 371-374 (1993).
211. Azzam, R. M. A., "Polarization Michelson Interferometer (POLMINT) as a Global Polarization State Generator and for Measurement of the Coherence and Spectral Properties of Quasi‑ Monochromatic Light," Rev. Sci. Instrum. 64, 2834‑2838 (1993).
212. Azzam, R. M. A., and Forgala, G. W., "Creation of an Optical XYZ Coordinate System Using Bidirectional Blazing from a Symmetric Triangular‑Groove Grating in a Conical Diffraction Mount," Opt. Lett. 18, 2162-2164 (1993).
213. Azzam, R. M. A., and Kan'an A. M. "In‑Line Variable‑Phase Reflection Retarder Using a Coated Deformable Three‑Mirror System," Pure Appl. Opt. (J. Europ. Opt. Soc. Part A) 3, 1-5 (1994).
214. Kan'an, A. M., and Azzam, R. M. A., "In‑Line Quarter‑Wave Retarders for the IR Using Total Refraction and Total Reflection in a Prism," Opt. Eng. 33, 2029-2033 (1994).
215. Kan'an, A. M., and Azzam, R. M. A., "Principal Angles and Principal Azimuths of an In-Line Three-Reflection Bare-Mirror System: Application to Circular Polarization of VUV Radiation," SPIE Proc. 2265, 9-14 (1994).
216. Howlader, M. M. K., and Azzam, R. M. A., "Periodic and Quasiperiodic Nonquarterwave Multilayer Coatings for 90o Reflection Phase Retardance at 45o Angle of Incidence," SPIE Proc. 2265, 86-98 (1994).
217. Azzam, R. M. A., "Fresnel's Interface Reflection Coefficients for the Parallel and Perpendicular Polarizations: Global Properties and Facts Not Found in your Textbook," SPIE Proc. 2265, 120-139 (1994).
218. Azzam, R. M. A., "Polarized Light Reflectometer," Appl. Opt. 33, 6009-6011 (1994).
219. Azzam, R. M. A., and Howlader, M. M. K., "Measurement of the Thickness of Dielectric Thin Films on Silicon Photodetectors Using the Angular Response to Incident Linearly Polarized Light," IEEE Trans. Instrum. Measur. 43, 799-802 (1994).
220. Azzam, R. M. A., "Simple General Analysis of the Polarization-Dependent Insertion Loss of a Linear Optical System," Pure Appl. Opt. (J. Europ. Opt. Soc. Part A) 3, 731-736 (1994).
221. Howlader, M. M. K., and Azzam, R. M. A., "Periodic and Quasiperiodic Nonquarterwave Multilayer Coatings for 90-deg Reflection Phase Retardance at 45-deg Angle of Incidence," Opt. Eng. 34, 869-875 (1995).
222. Kan'an, A. M., and Azzam, R. M. A., "Principal Angles and Principal Azimuths of In-Line Symmetric Three-Reflection Mirror System: Application to Circular Polarization of Vacuum Ultraviolet Radiation," Opt. Eng. 34, 1551-1557 (1995).
223. Azzam, R. M. A., and Howlader, M. M. K., "Real-Time Adsorption/Desorption Thin-Film Optical Monitor Using a Windowless Reflective Silicon Detector," Rev. Sci. Instrum. 66, 4362-4366 (1995).
224. Azzam, R. M. A., Howlader, M. M. K., and Georgiou, T. Y., "Single-Layer-Coated Surfaces with Linearized Reflectance Versus Angle of Incidence: Application to Passive and Active Silicon Rotation Sensors," J. Opt. Soc. Am. A 12, 1790-1796 (1995).
225. Azzam, R. M. A., and Kan'an, A. M., "Extreme Ultraviolet Polarizing Optics Using Bare and Aluminum-Coated Silicon Carbide," Appl. Opt. 34, 6438-6442 (1995).
226. Bouzid, A., Abushagur, A. G., El-Sabae, A., and Azzam, R. M. A., "Fiber-Optic Four-Detector Polarimeter," Opt. Commun. 118,329-334 (1995).
227. Azzam, R. M. A., "Characterization of Native and Adsorbed Thin Films on Silicon Detector Surfaces: Static and Kinetic Applications," Thin Solid Films 270, 289-294 (1995).
228. Cui, Y. and Azzam, R. M. A., "Calibration and Testing of a Sixteen-Beam Grating-Based Division-of-Amplitude Photopolarimeter," Rev. Sci. Instrum. 66, 5552-5558 (1995).
229. Azzam, R. M. A., and Howlader, M. M. K. "Bilayer Coatings that Produce 90o Differential Reflection Phase Shift at Oblique Incidence," Thin Solid Films 272, 143-147 (1996).
230. Azzam, R. M. A., "Ellipsometry for the Characterization of Optical Coatings," Rev. Laser Eng. (Japan) 24, 209-219 (1996).
231. Cui, Y. and Azzam, R. M. A., "Sixteen-Beam Grating-Based Division-of-Amplitude Photopolarimeter," Opt. Lett. 21, 89-91 (1996).
232. Cui, Y. and Azzam, R. M. A. "Applications of the Normal-Incidence Rotating-Sample Ellipsometer to High- and Low-Spatial-Frequency Gratings," Appl. Opt. 35, 2235-2238 (1996).
233. Azzam, R. M. A., and Howlader, M. M. K., "Silicon-Based Polarization Optics for the 1.30 and 1.55 μm Communication Wavelengths," J. Lightwave Technol. 14, 873-878 (1996).
234. Cui, Y., and Azzam, R. M. A., "Determination of Refractive Index and Thickness of Transparent Pellicles Using Polarization-Independent Absentee-Layer Condition," Appl. Opt. 35, 5040-5043 (1996).
235. Liu, J., and Azzam, R. M. A., "Infrared Quarter-Wave Reflection Retarders Based on High-Spatial-Frequency Dielectric Surface-Relief Gratings on Gold Substrates at Oblique Incidence," Appl. Opt. 35, 5557-5562 (1996).
236. Azzam, R. M. A., “Recent Developments of Division-of-Amplitude Photopolarimeters,” Proc. SPIE 2873, 1-4 (1996).
237. Liu, J., and Azzam, R. M. A., “Field-of-View Analysis of the Four-Detector Photopolarimeter (Stokesmeter),”Proc. SPIE 2873, 78-81 (1996).
238. Azzam, R. M. A., and Howlader, M. M. K., “Infrared Reflection Polarizers Using Uniform and Diffuse Low-Index Layers Buried in High-Index Substrates,” Proc. SPIE 2873, 148-151 (1996).
239. El-Saba, A. M., Azzam, R. M. A., and Abushagur, M. A. G., “Parallel-Slab Division-of-Amplitude Photopolarimeter,” Opt. Lett. 21, 1709-1711 (1996).
240. Liu, J. and Azzam, R. M. A., “Polarization Properties of Corner Cube Retroreflectors: Theory and Experiment,” Appl. Opt.36, 1553-1559 (1997).
241. Azzam, R. M. A., and Howlader, M. M. K., “Infrared Reflection Polarizers Using Uniform and Gaussian Low-Index Layers Buried in High-Index Substrates,” Opt. Eng. 36, 217-221 (1997).
242. Mahmoud, F., and Azzam, R. M. A., "Optical Monitoring of Contamination on High-Voltage Insulator Surfaces," IEEE Trans. Dielectrics & Elect.4, 33-38 (1997).
243. Liu, J. and Azzam, R. M. A., “Corner-Cube Four-Detector Photopolarimeter,” Opt. Laser Technol. 29, 233-238 (1997).
244. Azzam, R. M. A., “Mueller-Matrix Ellipsometry: A Review,” Proc. SPIE 3121, 396-405 (1997).
245. Azzam, R. M. A., and Nazim Uddin, M., “Four-Port Fabry-Perot/Michelson Interferometer: Polarization-Dependent Response and Ellipsometry,” Proc. SPIE 3121, 406-425 (1997).
246. Liu, J. and Azzam, R. M. A., “Effect of Light-Beam Deviation on the Instrument Matrix of the Four-Detector Photopolarimeter,” Opt. Eng. 36, 943-951 (1997).
247. Azzam, R. M. A., El-Saba, A. M., and Abushagur, M. A. G., “Spectrophotopolarimeter Based on Multiple Reflections in a Coated Dielectric Slab,” Thin Solid Films 313/314, 53-57 (1998).
248. Azzam, R. M. A., “Differential Reflection Phase Shift Under Conditions of Attenuated Internal Reflection,” J. Opt. Soc. Am. A 16, 1700-1702 (1999).
249. El-Saba, A. M., Azzam, R. M. A, and Abushagur, M. A. G., “Performance Optimization and Light-Beam-Deviation Analysis of the Parallel-Slab Division-of-Amplitude Photopolarimeter,” Appl. Opt. 38, 2829-2836 (1999).
250. Azzam, R. M. A., “Correlation of Fresnel’s Interface Reflection Coefficients of External and Internal Reflection at the Same Angle of Incidence,” Proc. SPIE 3754, 88-98 (1999).
251. Azzam, R. M. A., “Polarization Michelson Interferometer: Principles and Applications,” Proc. SPIE 3754, 162-168 (1999).
252. El-Saba, A. M., Azzam, R. M. A., Abushagur, M. A. G., Centamore, C. L., and Arp, A. L., “Infrared Parallel-Slab Division-of-Amplitude Photopolarimeter,” Proc. SPIE 3754, 246-259 (1999).
253. El-Saba, A. M., and Azzam, R. M. A., “Design and Analysis of a Beam Splitter for the Equipartition of Infrared Input Power,” Proc. SPIE 3754, 336-345 (1999).
254. Krishnan, S., Hampton, S., Taylor, B., and Azzam, R. M. A., “Spectral Polarization Measurements Using the Grating Division-of-Amplitude Photopolarimeter,” in Diffractive Optics and Micro-Optics, OSA Technical Digest (Optical Society of America, Washington, DC, 2000), pp. 192-193.
255. Azzam, R. M. A., “Poincaré Sphere Representation of the Fixed-Polarizer Rotating-Retarder Optical System,” J. Opt. Soc. Am. A 17, 2105-2107 (2000).
256. Azzam, R. M. A., “Ellipsometry: a Sophisticated Tool for Optical Metrology,” Proc. SPIE 4099, 184-196 (2000).
257. El-Saba, A. M., and Azzam, R. M. A., “High-Efficiency All-Dielectric Strip-Coated Beam
Splitters for the Equi-Partition of Infrared Input Power,” Proc. SPIE 4133, 24-33 (2000).
258. Liu, J., and Azzam, R. M. A., “Half-Wave Infrared Reflection Retarders Using Two-Dimensional ZnS Surface-Relief Grating on Au Substrate at 45-Degree Angle of Incidence,” Proc. SPIE 4133, 34-43 (2000).
259. Azzam, R. M. A., and Mahmoud, F. A., “Tilted Bilayer Membranes as Simple Transmission Quarter-Wave Retardation Plates,” J. Opt. Soc. Am. A 18, 421-425 (2001).
260. Azzam, R. M. A. and Howlader, M. M. K., “Fourth- and Sixth-Order Polarization Aberrations of Antireflection-Coated Optical Surfaces,” Opt. Lett. 26, 1607-1608 (2001).
261. Azzam, R. M. A., “Fast Ellipsometry for In-Situ Real-Time Monitoring and Control of Industrial Thin Film Processes,” in Proceedings of the International Conference on Industrial Electronics, Technology, and Automation IETA2001 (2001).
262. El-Saba, A. M., and Azzam, R. M. A., “Performance of Reflection Polarizers Using Bare Semiconductor Substrates in the Visible and Near-UV Spectrum,” Proc. SPIE 4481, 1-9 (2002).
263. Howlader, M. M. K., and Azzam, R. M. A., “Negligible Polarization Aberrations of Antireflection-Coated Optical Systems,” Proc. SPIE 4481, 58-63 (2002).
264. Azzam, R. M. A., and Ugbo, E. E., “Angular Range for Reflection of p-Polarized Light at the Surface of an Absorbing Medium with Reflectance Below That at Normal Incidence,” J. Opt. Soc. Am. A 19, 112-115 (2002).
265. Azzam, R. M. A., and Mahmoud, F. A., “Symmetrically Coated Pellicle Beam Splitters for Dual Quarter-Wave Retardation in Reflection and Transmission,” Appl. Opt. 41, 235-238 (2002).
266. El-Saba, A. M. and Azzam, R. M. A., “Design and Analysis of Strip-Coated Parallel-Slab Beam Splitter for the Equipartition of Infrared Input Power,” Opt. Eng. 41, 200-204 (2002).
267. Azzam, R. M. A., and De, A., “Circular Polarization Beam Splitter that Uses Frustrated Total Internal Reflection by an Embedded Symmetric Achiral Multilayer Coating,” Opt. Lett. 28, 355-357 (2003).
268. Krishnan, S, Hampton, S., Rix, J., Taylor, B., and Azzam, R. M. A., “Spectral Polarization Measurement by use of the Grating Division-of-Amplitude Photopolarimeter,” Appl. Opt. 42, 1216-1227 (2003).
269. Azzam, R. M. A., and De, A., “Optimal Beam Splitters for the Division-of-Amplitude Photopolarimeter,” J. Opt. Soc. Am. A 20, 955-958 (2003).
270. El-Saba, A. M., and Azzam, R. M. A., “Power, Efficiency, and Polarization Analysis of a Beam Splitter for the Equipartition of Infrared Input Power in the Presence of Angular, Film-Thickness, and Spectral Deviations,” Opt. Eng. 42, 3487-3490 (2003).
271. Krishnan, S., Hampton, S, and Azzam, R. M. A., “Spectroscopic ellipsometry using the grating division-of-amplitude photopolarimeter (G-DOAP),” Thin Solid Films 455-456, 24-32 (2004).
272. Azzam, R. M. A., Sudradjat, F. F., and Nazim Uddin, M., “Prism spectroscopic ellipsometer,” Thin Solid Films 455-456, 54-60 (2004).
273. Azzam, R. M. A., “Phase shifts that accompany total internal reflection at a dielectric-dielectric interface,” J. Opt. Soc. Am. A 21, 1559-1563 (2004).
274. Azzam, R. M. A., and Spinu, C. L., “Achromatic angle-insensitive quarter-wave retarder based on total internal reflection at the Si-SiO2 interface,” J. Opt. Soc. Am. A 21, 2019-2022 (2004).
275. Azzam, R. M. A. and Sudradjat, F. F., “Single-layer-coated beam splitters for the division-of-amplitude photopolarimeter,” Appl. Opt. 44, 190-196 (2005).
276. Azzam, R. M. A., De, A., and Sudradjat, F. F., “Bilayer pellicle and bilayer-coated beam splitters for the division-of-amplitude photopolarimeter,” Opt. Eng. 44, 073802- 073811 (2005).
277. Azzam, R. M. A., and Spinu, C. L., “Linear-to-circular polarization transformation upon optical tunneling through an embedded low-index film,” Opt. Lett. 30, 3183-3185 (2005).
278. Azzam, R. M. A., “Phase shifts associated with frustrated total internal reflection and optical tunneling by an embedded low-index film,” J. Opt. Soc. Am. A 23, 960-965 (2006).
279. Azzam, R. M. A., and Perla, S. R., “Polarizing properties of embedded symmetric trilayer stacks under conditions of frustrated total internal reflection,” Appl. Opt. 45, 1650-1656 (2006).
280. Azzam, R. M. A., “Dividing a light beam into two beams of orthogonal polarizations by reflection and refraction at a dielectric surface, Opt. Lett. 31, 1525-1527 (2006).
281. Azzam, R. M. A., “Broadband IR 50% - 50% beams splitters for s-polarized light,” Appl. Opt. 45, 4572-4575 (2006).
282. Azzam, R. M. A., “Parallel-slab polarizing beam splitter and photopolarimeter,” Appl. Opt., accepted for publication.